| Description: |
The scanning electron microscope (SEM) is used to image and analyse a range of materials from rocks, metals, biological samples and meteorites. The Department of Earth Science houses a versatile FEI Quanta 650 scanning electron microscope.
It is equipped with:
- A field emission electron source for high resolution imaging
- Secondary and Backscatter electron detectors
- An Oxford Instruments EDS system for major and minor elemental characterization and mapping
- An Oxford Instruments electron backscatter diffraction (EBSD) detector for measuring crystallographic structure of materials
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