Zeiss Sigma 300 FEG-SEM

Managed by Dunn School of Pathology
Location PATHOLOGY, Oxford Science Area
Facility Dunn School Bioimaging Facility - Electron Microscopy
Availability Generally available; online booking calendar operates
Shareability Yes
More information The Zeiss Sigma 300 FEG-SEM is used for imaging a huge range of materials and biological samples. It is capable of high resolution imaging at low accelerating voltages (eg: 2kV) and is therefore particularly well suited to imaging beam reactive samples such as cells/tissues and biomaterials. The Sigma 300 is equipped with Everhart-Thornley and InLens secondary electron detectors, a backscatter electron detector and a STEM detector. It is also equipped with an Oxford Instruments Ultim Xtreme x-ray detector for Energy Dispersive X-ray Spectroscopy, enabling elemental mapping and quantification at the SEM level. We also have a Quorum 150R ES coater for gold sputter coating and carbon evaporative coating of non-conductive samples.   

 

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